Multiple reflection from surface X-ray optics
Identifieur interne : 003635 ( Main/Exploration ); précédent : 003634; suivant : 003636Multiple reflection from surface X-ray optics
Auteurs : M. A. Kumakhov [Russie] ; F. F. Komarov [Russie]Source :
- Physics Reports [ 0370-1573 ] ; 1990.
Abstract
The present work formulates the basic concepts of multiple reflection X-ray optics which employs the special geometry of reflecting surfaces. The problems of the X-ray beam transport and bending, as well as the design of new focusing systems are discussed in this paper. It is shown that the new optics has broad angular aperture, i.e., of the order of many times the angles of total external reflection. This optics works in a broad spectrum interval, from 0.1 keV to several MeV.
Url:
DOI: 10.1016/0370-1573(90)90135-O
Affiliations:
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